SABi-YOLO: static axial-bias modelling improves the localization of elongated PCB defects
Scientific Reports, Published online: 03 November 2026; doi:10.1038/s41598-026-79381-6 SABi-YOLO: static axial-bias modelling improves the localization of elongated PCB defects
We haven't written up this one. Scientific Reports has the full story — the link below goes straight to it.