JEOL: Sales launch of HAXIS: The New Low-angle Ion Milling Scanning Electron Microscope
TOKYO — JEOL Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. HAXIS Low-angle Ion Milling Scanning Electron Microscope Background of development As advanced semiconductor device structures continue to shrink and grow more complex, it has become difficult […]
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