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Tiny oxygen gaps may determine whether next-generation memory films store data well

Researchers have captured in real time the "birth moment" when the performance of a next-generation memory material is determined. The key lies in controlling oxygen vacancies, microscopic defects created when oxygen atoms are missing from their normal positions.

Tiny oxygen gaps may determine whether next-generation memory films store data well

We haven't written up this one. Phys.org has the full story — the link below goes straight to it.

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